XRD 2
- High resolution powder diffraction
- Powder and thin film samples
- Thermal/vacuum stage capable of heating samples up to 1200°C
- Independent Theta & 2-Theta control
- Multichannel silicon strip detector
- Goebel mirror for parallel x-ray beam
- Low angle measurements down to 2°
- Capillary sample holder for liquid samples
Stage changes between thermal/vacuum and standard mode upon request.
| Tool Status | Up | ||
|---|---|---|---|
| Manufacturer | Bruker | ||
| Model | D8 Advance | ||
| Typical Application | High resolution powder diffraction | ||
| Location | 6140.3 | ||
| Related Documents | |||
| Contact Information |
Training
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