Simon Fraser University

XRD 2


- High resolution powder diffraction
- Powder and thin film samples
- Thermal/vacuum stage capable of heating samples up to 1200°C
- Independent Theta & 2-Theta control
- Multichannel silicon strip detector
- Goebel mirror for parallel x-ray beam
- Low angle measurements down to 2°
- Capillary sample holder for liquid samples
 

Stage changes between thermal/vacuum and standard mode upon request.

 


Tool Status Up
Manufacturer Bruker
Model D8 Advance
Typical Application High resolution powder diffraction
Location 6140.3
Related Documents
Contact Information

Training

Dennis Hsiao hsiao@4dlabs.ca