Simon Fraser University

Atomic Force Microscope


High resolution Atomic Force microscope supporting a wide range of applications.

Scanning modes include:

  • Contact
  • Tapping (air)
  • Non-contact
  • Lateral force microscopy
  • Electric force microscopy
  • Piezoresponse force microscopy
  • Conductive AFM
  • Scanning Tunneling Microscopy
  • Kelvin Probe Force spectroscopy

Key specifications include:

  • <35 pm Z noise
  • <150 pm XY noise
  • 90 um x 90 um XY scan range
  • 10 um Z scan range

Additional features include:

  • 200 mm motorized position stage
  • -35 °C - 250 °C sample temperature control
  • capable of scanning in fluid

 


Tool Status Up
Manufacturer Bruker
Model Dimension Icon
Typical Application Atomic resolution surface analysis
Location 7130
Related Documents
Contact Information

Training

Chris Balicki balicki@4dlabs.ca