Simon Fraser University

Reflectometer


- measurement of thickness and refractive index of a wide range of film thicknesses (3 nm < t < 250 μm)
- acquisition of K (extension coefficient) and N (reflectivity index) for dielectric materials


Tool Status Up
Manufacturer Filmetrics
Model F-20 UVX
Typical Application Film thickness analysis
Location 6060.2
Related Documents
Contact Information

Training

Grace Li li@4dlabs.ca